Automated Test Form Generation Critique of the Research Paper

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Automated Test Form Generation

Critique of the Journal Article "Automated Test Form Generation" by Wim J. van der Linden and Qi Diao

Van der Linden, J.M. & Diao, Q. (2013). Integrating test-form formatting into automated test assembly. Applied Psychological Measurement, 37(5) 361 -- 374

Retrieved: http://www.utwente.nl/gw/omd/Medewerkers/artikelen/vdLinden/artikelen%20vanaf%20juni%202011/APM%202013,%20361-374.pdf

The ordering of items in test forms and the selection of test items from a database can be extremely tedious and laborious when done manually. It would be extremely advantageous to be able to do both simultaneously using automated test form generation (ATFG). But the ATFG process can be unwieldy and cumbersome given the number of variables the creator must tackle. For example, "for an item bank of size 2,000, test length of 50 items, and upper limit of the number of pages in the test form equal to 15, the number of variables in the model is equal to 1,500,000" (Van der Linden & Diao 2013: 361). According to the article, "Integrating test-form formatting into automate test assembly" from Applied Psychological Measurement, "one of the goals of this research is to find out if test-production problems of realistic sizes can be solved" and make the simultaneous generation process easier for test designers (Van der Linden & Diao 2013: 361).

The process of automated test form generation consists of two steps.

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The first is the selection of items from a database and ordering and formatting the item into the actual test form itself. "ATA involves the selection of the items for a test form from an item bank subject to a potentially large set of content and statistical specifications while optimizing their measurement properties" through the use of mixed integer programming (MIP)" (Van der Linden & Diao 2013: 361). While MIP is mainly used for test selection, it can also "be used to optimize the second step (automated test-form generation [ATFG]" (Van der Linden & Diao, 2013: 361). The purpose of the study is to determine how this can be accomplished in an efficient manner. The objective is to explore whether it is possible to use ATA and ATFG simultaneously for more efficient test generation and "then evaluate their performances against the case of separate models for ATA and ATFG for a series of applications with realistic item bank sizes and test lengths" (Van der Linden & Diao, 2013: 361).

Previous authors have found this quite challenging so rather than a formal literature review,….....

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